CMSC 2012 Showcases 27 Technical Presentations from Metrology Experts

The Coordinate Metrology Society (CMS) announced today twenty-seven technical presentations are scheduled for its annual Coordinate Metrology Systems Conference (CMSC) from July 16 - 20, 2012, at The Roosevelt Hotel, in New Orleans, Louisiana. Each year, hundreds of 3D measurement/inspection professionals and scientists gather to share expertise, ideas, concepts, and theory during this 5-day event.

The CMS has accepted technical papers from metrology experts and scientists from The Boeing Company, Lockheed Martin, Rolls-Royce, NIST, Argonne National Laboratory, National Research Council Canada, Hitachi Engineering and Services Company, Northrop Grumman, US Army Research Laboratory, US Navy, Clemson University, Purdue University, Electroimpact Inc., Institute of Measurement and Automatic Control at Leibniz Universität, ISRO Satellite Centre, Schneider-Electric, and more.

CMSC presentations will cover a diversity of subject matter related to 3D metrology, including trends, techniques, and technology. Presentation topics range from "Curing Cancer with Metrology" to "Optical Metrology Guidance for Precision Robotic Machining of Composites". The roster will also include successful applications of photogrammetry, laser trackers, articulating arms, laser radar, 3D scanners, 3D vision systems and more.

The CMSC conference lineup includes a new Measurement Study, valuable workshops, networking events, and a packed Exhibition Hall featuring portable measurement systems (PCMMs), software, accessories, peripherals, and service providers servicing the needs of the industrial measurement marketplace. The CMS Certification Committee will also host a series of "pilot" certification examinations open to all registered attendees and exhibitors.

The Coordinate Metrology Systems Conference is an annual event sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe. CMSC has achieved world renown for its comprehensive program of top-shelf technical papers and applications presentations given by industry experts from science/research laboratories and leading manufacturing industries. No other trade show rivals the high level of authoritative information provided by CMS members and master users of metrology instrumentation, software, and peripheral equipment for quality control, quality production, and precision assembly and metrology-aided alignment.

For more information or to register, visit: www.cmsc.org/cmsc-attendee-information

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